Introduction to ISO 11938:2012
Over the past 50 years, electron probe microanalysis (EPMA) has been created and has numerous applications in both science and industry. For instance, mineralogy and metallurgical research make substantial use of both precise quantitative and qualitative analysis. With the development of digital processing techniques brought about by computer advancements in recent years, element distributions may now be qualitatively observed through the use of color mapping techniques, as opposed to X-ray dot pictures. These make it possible to compare and assess items to maintain quality. Careful selection of the experimental parameters is necessary for particle analysis and/or phase analysis utilizing mapping, and a standard must be available for this purpose to get consistent and trustworthy results. MaTestLab is one of the best testing service providers, with the best network of testing laboratories in the USA to carry out ISO 11938:2012 tests for our clients.
ISO 11938:2012 Test Method
Mapping Analysis
| Location, size, and pixel selection | The location and size of the required map area on the specimen are selected, along with the number of pixels to meet the required spatial resolution. The method of acquisition (stage or beam mapping) is chosen. Additionally, the element and instrument conditions are selected and applied. |
| Collection of results and display data | Characteristic peak and background X-rays, along with any required electron signals, are collected at each pixel. All data is stored in the computer memory, point by point. The chosen correction method is applied to the X-ray data. Finally, the data can be displayed as pseudo-color maps. |
ISO 11938:2012 Test Specimens
| Specimen Details | The specimen must be treated to reduce the impact of mistakes and artifacts on the mapping analysis without jeopardizing its integrity. The specimens ought to be dust-free and spotless. |
| Specimen Size | Carbon typically has to be between 10 and 20 nm thick to create effective conduction. The same element should be applied to the reference material and the unknown item at the same thickness. |
ISO 11938:2012 Test Results
ISO 11938:2012 describes techniques for elemental-mapping analysis in electron probe microanalysis employing wavelength dispersive spectroscopy. It describes how to gather characteristic peaks and background X-rays at each pixel, record the data in computer memory, and add any required electron signals.
ISO 11938:2012 Related Tests
ISO 11938:2012 is related to tests including ISO 5725-6 for accuracy values, ISO 14594 for using wavelength dispersive spectroscopy to determine experimental parameters, and ISO 16592:2006 for measuring the carbon contents of steel.
