The ASTM F76 standard test procedure is employed to determine resistivity, Hall coefficient, and Hall mobility. It helps to figure out the best material for making semiconductor devices. ASTM F76 can infer other characteristics for material specification under certain conditions, as specified in the Appendix, such as charge carrier density and drift mobility.
The standard test method ASTM F76 includes two ways for assessing the resistivity and Hall coefficient of single-crystal semiconductor specimens. The test specimen requirements are the most significant difference between these test techniques. The values expressed in the accepted metric units are taken as standard. The standard will be the values expressed in accepted metric units.
ASTM F76 Specimen Preparation Guide
For ASTM F76, the thickness must be homogeneous to within 1% of the total thickness and should not exceed 0.10 cm. The specimen’s entire length should be between 1.0 and 1.5 cm.
